Photoluminescence(PL) spectroscopy is effective tool of Non Destructive Testing, widely applied to semiconductor analysis such as the measurement of the band gap, in purity defects, compound semi conductor, and quality validation. In the infrared photoluminence range with disadvantage of weak signal, even experienced operator takes tedious time and energy to commissioning can result in weak PL spectral signal.

Compared with traditional dispersive spectrometer, Fourier transform FT spectroscopy based on mature theory and instrumentation, result in many advantages such as multi-channels, throughput, low noise, fast scan, and with sensitivity and SNR is significant higher.

Based on 20 years experience in researching weak signal and PL spectroscopy, launch this fourier transform infrared photoluminescence spectrometer.

SEP-8900PL features excellent sensitivity in the infrared range, super fast scan speed, easy-to-operate for expert and non-expert. It covers the range of 4000-12500cm-1 (800-2500nm), with a continuous modulation of pumped laser power, and sample temperature from room temperature up to 77K.

• Higher sensitivity to weak signal in the infrared range
• Fast scan speed < 1second
• Non-expert operation
• Broad range of 4000-12500cm-1 (800-2500nm)
• Higher spectral accuracy thanks to continuous modulation of pumped laser power
• Sample temperature from room temperature up to 77K.
• Multi-channel, high throughput, low noise and higher SNR.

• Advanced optoelectronic material research
• Rare earth photoluminescence material performance check
• Semiconductor wafer quality inspection
• Infrared optoelectronic device quality control

SEP-8900S  Brochure